FAVORITES|简体中文|ENGLISH
HOME > Atomic Force MicroscopeAtomic Force Microscope

AFM-5500



Key Features & Specifications

Instrument features

  • Highly modular microscope and scanner
  • Optional Integrated environmental & temperature control
  • Easy fluid operation with open cell
  • Easy sample access with top-down scanning

Description

The Keysight 5500 AFM/SPM microscope offers numerous unique features, such as patented top-down scanning and unrivalled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with our unique sample plates designed for your application including imaging in fluids.

A top-down optical axis through the scanner allows an unobstructed view of the cantilever and the sample without sacrificing sample handling. The scanner’s modular nose cone makes changing imaging modes quick and easy. The Keysight 5500 SPM/AFM is a high performance system that facilitates advanced applications solutions. It offers atomic resolution and is ideal for electrochemistry, polymers, and soft material applications.


HOME ABOUT US PRODUCTS TECHNICAL SUPPORT NEWS TALENT CONTACT US
Copyright 2015-2016 TIANJIN OSBORN TECHNOLOGIES CO.,LTD. ICP:19002142号-1 公安备案号:12010402000206